Structure and optical properties of SnS thin film prepared by pulse electrodeposition

Journal of Alloys and Compounds

Volumn 468, Issue 1-2, 2009, Pages 254-257

  Yue, G H ^a   Peng, D L ^a   Yan, P X ^b   Wang, L S ^a   Wang, W ^a   Luo, X H ^a  

^a XIAMEN UNIVERSITY   (China)

^b LANZHOU UNIVERSITY   (China)

Author keywords

Optical properties; Pulse electrodeposition; SnS films

Indexed keywords

CRYSTAL STRUCTURE; ELECTRODEPOSITION; ENERGY GAP; FILM PREPARATION; GALLIUM ALLOYS; INDIUM; OPTICAL DATA PROCESSING; OPTICAL PROPERTIES; OXIDE FILMS; THIN FILM DEVICES; THIN FILMS; TIN; TITANIUM COMPOUNDS; X RAY ANALYSIS;

ATOMIC RATIOS; AVERAGE GRAIN SIZES; COATED GLASSES; DIRECT BAND GAPS; ENERGY DISPERSIVE; EQUAL SIZES; INDIUM TIN OXIDES; OPTICAL BANDS; OPTICAL MEASUREMENTS; ORTHORHOMBIC STRUCTURES; PULSE ELECTRODEPOSITION; REFLECTANCE DATUMS; SNS FILMS; X-RAY DIFFRACTIONS;

OPTICAL FILMS;

EID: 58049202698     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.01.047     Document Type: Review

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