High-gradient nanomagnets on cantilevers for sensitive detection of nuclear magnetic resonance

ACS Nano

Volumn 6, Issue 11, 2012, Pages 9637-9645

  Longenecker, Jonilyn G ^a   Mamin, H J ^b   Senko, Alexander W ^c   Chen, Lei ^a   Rettner, Charles T ^b   Rugar, Daniel ^b   Marohn, John A ^a  

^a Cornell University ^*  (United States)

^b IBM ALMADEN RESEARCH CENTER   (United States)

^c School of Operations Research and Industrial Engineering   (United States)

Author keywords

magnetic resonance force microscopy; magnetometry; nanofabrication; superconducting quantum interference device; surface induced dissipation; X ray photoelectron spectroscopy

Indexed keywords

COERCIVE FIELD; FORCE SENSOR; FREQUENCY DEPENDENCE; HIGH FIELD; IMAGING EXPERIMENTS; LAYER THICKNESS; MAGNETIC RESONANCE FORCE MICROSCOPY; MAGNETIC TIP; MAGNETOMETRY; NANOMAGNETS; NM RESOLUTION; NUCLEAR SPINS; POLYSTYRENE FILMS; SENSITIVE DETECTION; SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE MAGNETOMETRY;

COBALT; EXPERIMENTS; MAGNETIC FORCE MICROSCOPY; MAGNETIC MATERIALS; MAGNETOMETERS; NANOMAGNETICS; NANOTECHNOLOGY; PHOTOELECTRONS; POLYSTYRENES; SATURATION MAGNETIZATION; SEPARATION; SIGNAL DETECTION; SQUIDS; SUPERCONDUCTING DEVICES; X RAY PHOTOELECTRON SPECTROSCOPY;

NANOCANTILEVERS;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EQUIPMENT FAILURE; MAGNET; MICROELECTROMECHANICAL SYSTEM; NANOTECHNOLOGY; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; TRANSDUCER;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MAGNETIC RESONANCE SPECTROSCOPY; MAGNETS; MICRO-ELECTRICAL-MECHANICAL SYSTEMS; NANOTECHNOLOGY; TRANSDUCERS;

EID: 84870428077     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn3030628     Document Type: Article

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