Method for atomic-layer-resolved measurement of polarization fields by nuclear magnetic resonance

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 4, 2000, Pages 2255-2262

  Kempf, James G ^a   Weitekamp, Daniel P ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23044522075     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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