Experimental determination of conduction and valence bands of semiconductor nanoparticles using Kelvin probe force microscopy

Journal of Nanoparticle Research

Volumn 15, Issue 1, 2013, Pages

  Zhang, Wen ^a,b   Chen, Yongsheng ^a  

^a Georgia Institute of Technology   (United States)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Conduction band; KPFM; Photocatalyst; Valence band; Water splitting; Work function

Indexed keywords

ALUMINA; ALUMINUM OXIDE; CERIUM OXIDE; CONDUCTION BANDS; COPPER OXIDES; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; HEMATITE; II-VI SEMICONDUCTORS; MAGNETIC SEMICONDUCTORS; NANOPARTICLES; NANOSTRUCTURED MATERIALS; PHOTOCATALYSTS; PHOTOCATALYTIC ACTIVITY; SURFACE WATERS; TIO2 NANOPARTICLES; TITANIUM DIOXIDE; WIDE BAND GAP SEMICONDUCTORS; WORK FUNCTION; ZINC OXIDE;

EXPERIMENTAL DETERMINATION; KELVIN PROBE FORCE MICROSCOPY; KPFM; PHOTOCATALYTIC MATERIALS; SEMICONDUCTOR NANOMATERIALS; SEMICONDUCTOR NANOPARTICLES; VALENCE-BAND-EDGE ENERGIES; WATER SPLITTING;

VALENCE BANDS;

ALUMINUM OXIDE; COPPER OXIDE; IRON OXIDE; METAL OXIDE; NANOPARTICLE; SURFACE WATER; TITANIUM DIOXIDE; ZINC OXIDE;

ADSORPTION; ARTICLE; CHEMICAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRON MICROSCOPE; KELVIN PROBE FORCE MICROSCOPY; MOLECULAR PROBE; PHOTOCATALYSIS; PRIORITY JOURNAL; SEMICONDUCTOR;

EID: 84870154818     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-012-1334-2     Document Type: Article

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