Optimization of parametric yield: A tutorial

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 1992, Pages

  Director, S W ^a   Feldmann, P ^a,b   Krishna, K ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MANUFACTURING PROCESS; PARAMETRIC YIELD; YIELD LOSS;

INTEGRATED CIRCUITS;

EID: 84870042024     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICC.1992.589963     Document Type: Conference Paper

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