Statistical Design Centering and Tolerancing Using Parametric Sampling

IEEE Transactions on Circuits and Systems

Volumn 28, Issue 7, 1981, Pages 692-702

  Singhal, Kishore ^a   Pinel, J F ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC CIRCUITS;

EID: 0019592219     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1981.1085029     Document Type: Article

References (21)

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