-
1
-
-
0018520451
-
Theoretical and computational aspects of the optimal design centering, tolerancing, and tuning problem
-
Sept
-
E. Polak and A. Sangiovanni-Vincentelli, “Theoretical and computational aspects of the optimal design centering, tolerancing, and tuning problem,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 795–813, Sept. 1979.
-
(1979)
IEEE Trans. Circuits Syst
, vol.CAS26
, pp. 795-813
-
-
Polak, E.1
Sangiovanni-Vincentelli, A.2
-
2
-
-
0016928134
-
A nonlinear programming approach to optimal design centering, tolerancing, and tuning
-
Mar
-
J. W. Bandler, P. C. Liu, and H. Tromp, “A nonlinear programming approach to optimal design centering, tolerancing, and tuning,” IEEE Trans. Circuits. Syst., vol. CAS-23, pp. 155–165, Mar. 1976.
-
(1976)
IEEE Trans. Circuits. Syst
, vol.CAS23
, pp. 155-165
-
-
Bandler, J.W.1
Liu, P.C.2
Tromp, H.3
-
3
-
-
0017515253
-
The simplicial approximation approach to design centering
-
July
-
S. W. Director and G. D. Hatchtel, “The simplicial approximation approach to design centering,” IEEE Trans. Circuits Syst., vol. CAS:24, pp. 363–372, July 1977.
-
(1977)
IEEE Trans. Circuits Syst
, vol.CAS24
, pp. 363-372
-
-
Director, S.W.1
Hatchtel, G.D.2
-
4
-
-
0018023947
-
Optimal centering, tolerancing, and yield determination via updated approximations and cuts
-
Oct
-
J. W. Bandler and H. L. Abdel-Malek, “Optimal centering, tolerancing, and yield determination via updated approximations and cuts,” IEEE Trans. Circuits Syst. vol. CAS-25, pp. 853–871, Oct. 1978.
-
(1978)
IEEE Trans. Circuits Syst
, vol.CAS25
, pp. 853-871
-
-
Bandler, J.W.1
Abdel-Malek, H.L.2
-
5
-
-
0019241450
-
Design-centering: The quasi-convex, quasi-concave performance function case
-
Apr
-
L. M. Vidigal and S. W. Director, “Design-centering: The quasi-convex, quasi-concave performance function case,” in Proc. IEEE Int. Symp. on Circuits and Systems, (Houston, TX), pp. 43–46, Apr. 1980.
-
(1980)
Proc. IEEE Int. Symp. on Circuits and Systems, (Houston, TX)
, pp. 43-46
-
-
Vidigal, L.M.1
Director, S.W.2
-
6
-
-
0014896421
-
Optimization of electrical networks with respect to tolerance costs
-
G. Kjellstroem, “Optimization of electrical networks with respect to tolerance costs,” Ericsson Technics no. 3, pp. 157–175, 1970.
-
(1970)
Ericsson Technics
, Issue.3
, pp. 157-175
-
-
Kjellstroem, G.1
-
7
-
-
67649652530
-
On the efficient use of stochastic optimization in network design
-
Apr
-
G. Kjellstroem and L. Taxen, “On the efficient use of stochastic optimization in network design,” in Proc. IEEE Int. Symp. on Circuits and Systems, (Munich, Germany) pp. 714–717, Apr. 1976.
-
(1976)
Proc. IEEE Int. Symp. on Circuits and Systems, (Munich, Germany)
, pp. 714-717
-
-
Kjellstroem, G.1
Taxen, L.2
-
8
-
-
33747049275
-
Efficient Monte Carlo computation of circuit yield using importance sampling
-
(Phoenix, AZ), Apr
-
J. F. Pinel and K. Singhal, “Efficient Monte Carlo computation of circuit yield using importance sampling,” in Proc. IEEE Int. Symp. on Circuits and Systems, (Phoenix, AZ), pp. 575–578, Apr. 1977.
-
(1977)
Proc. IEEE Int. Symp. on Circuits and Systems
, pp. 575-578
-
-
Pinel, J.F.1
Singhal, K.2
-
9
-
-
0018520386
-
Computer-aided tolerance/correlation design of integrated circuits
-
Sept
-
A. R. Thorbjornsen and E. R. Armbruster, “Computer-aided tolerance/correlation design of integrated circuits,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 763–767, Sept. 1979.
-
(1979)
IEEE Trans. Circuits Syst
, vol.CAS26
, pp. 763-767
-
-
Thorbjornsen, A.R.1
Armbruster, E.R.2
-
10
-
-
0037906016
-
New statistical methods for assigning device tolerances
-
(Newton, MA), Apr
-
N. J. Elias, “New statistical methods for assigning device tolerances,” in Proc. IEEE Int. Symp. on Circuits and Systems, (Newton, MA), pp. 329–332, Apr. 1975.
-
(1975)
Proc. IEEE Int. Symp. on Circuits and Systems
, pp. 329-332
-
-
Elias, N.J.1
-
11
-
-
0018031726
-
Statistical design centering for electrical circuits
-
Nov
-
R. S. Soin and R. Spence, “Statistical design centering for electrical circuits,” Electron. Lett. vol. 14, no. 24, pp. 772–774, Nov. 1978.
-
(1978)
Electron. Lett
, vol.14
, Issue.24
, pp. 772-774
-
-
Soin, R.S.1
Spence, R.2
-
12
-
-
0018520825
-
A radial exploration approach to manufacturing yield estimation and design centering
-
Sept
-
K. S. Tahim and R. Spence, “A radial exploration approach to manufacturing yield estimation and design centering,” IEEE Trans. Circuits Syst., vol. CAS-26, pp. 768–774, Sept. 1979.
-
(1979)
IEEE Trans. Circuits Syst
, vol.CAS26
, pp. 768-774
-
-
Tahim, K.S.1
Spence, R.2
-
13
-
-
0019021338
-
A radial exploration algorithm for the statistical analysis of linear circuits
-
May
-
K. S. Tahim and R. Spence, “A radial exploration algorithm for the statistical analysis of linear circuits,” IEEE Trans. Circuits Syst., vol. CAS-27, pp. 421–425, May 1980.
-
(1980)
IEEE Trans. Circuits Syst
, vol.CAS27
, pp. 421-425
-
-
Tahim, K.S.1
Spence, R.2
-
14
-
-
80053631316
-
Some methods for statistical optimization of integrated microcircuits with statistical relations among the parameters of the components
-
Microelectronica (USA, translated from Russian)
-
B. V. Batalov, Yu. N. Belyakov, and F. A. Kurrnaev, “Some methods for statistical optimization of integrated microcircuits with statistical relations among the parameters of the components,” Microelectronica (USA, translated from Russian), pp. 228–238, 1978.
-
(1978)
, pp. 228-238
-
-
Batalov, B.V.1
Belyakov, Y.N.2
Kurrnaev, F.A.3
-
15
-
-
0019284392
-
Statistical design centering and toler ancing using parametric sampling
-
(Houston, TX), Apr
-
K. Singhal and J. F. Pinel, “Statistical design centering and toler ancing using parametric sampling,” in Proc. IEEE Int. Symp. on Circuits and Systems, (Houston, TX), pp. 882–885, Apr. 1980.
-
(1980)
Proc. IEEE Int. Symp. on Circuits and Systems
, pp. 882-885
-
-
Singhal, K.1
Pinel, J.F.2
-
17
-
-
0018922796
-
Design centering and tolerance assignment of electrical circuits with gaussian-distributed parameter values
-
Jan
-
R. Koblitz, “Design centering and tolerance assignment of electrical circuits with gaussian-distributed parameter values,” Archiv Elek. Übertragung. vol. 34, 30–37, Jan. 1980.
-
(1980)
Archiv Elek. Übertragung
, vol.34
, pp. 30-37
-
-
Koblitz, R.1
-
18
-
-
0019290786
-
A new approach to design centering based on a multiparameter yield-prediction formula
-
(Houston, TX), Apr
-
K. J. Antreich and R. K. Koblitz, “A new approach to design centering based on a multiparameter yield-prediction formula,” in Proc. IEEE Int. Symp. on Circuits and Systems, (Houston, TX), pp. 886–889, Apr. 1980.
-
(1980)
Proc. IEEE Int. Symp. on Circuits and Systems
, pp. 886-889
-
-
Antreich, K.J.1
Koblitz, R.K.2
-
19
-
-
0019697204
-
An interactive procedure to design centering
-
(Chicago, IL), Apr
-
K. J. Antreich and R. K. Koblitz, “An interactive procedure to design centering,” in Proc. IEEE Int. Symp. on Circuits and Systems, (Chicago, IL), pp.139–142, Apr. 1981.
-
(1981)
Proc. IEEE Int. Symp. on Circuits and Systems
, pp. 139-142
-
-
Antreich, K.J.1
Koblitz, R.K.2
-
21
-
-
0010945705
-
On the relative efficiencies of gradient methods
-
July
-
J. Greenstadt, “On the relative efficiencies of gradient methods,” Math. Comput., vol. 21, pp. 360–367, July 1967.
-
(1967)
Math. Comput
, vol.21
, pp. 360-367
-
-
Greenstadt, J.1
-
22
-
-
84937998009
-
The general component tolerance assignment problem in electrical networks
-
Ph.D. dissertation, Univ. of Pennsylvania, Philadelphia
-
B. J. Karafin, “The general component tolerance assignment problem in electrical networks,” Ph.D. dissertation, Univ. of Pennsylvania, Philadelphia, 1974.
-
(1974)
-
-
Karafin, B.J.1
-
23
-
-
0019592219
-
Statistical design centering and tolerancing using parametric sampling
-
July
-
K. Singhal and J. F. Pinel, “Statistical design centering and tolerancing using parametric sampling,” IEEE Trans. Circuits Syst., vol. CAS-28, pp. 692–702, July 1981.
-
(1981)
IEEE Trans. Circuits Syst
, vol.CAS28
, pp. 692-702
-
-
Singhal, K.1
Pinel, J.F.2
|