Improved methods for IC yield and quality optimization using surface integrals

1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers

Volumn , Issue , 1992, Pages 158-161

  Feldmann, Peter ^a   Director, Stephen W ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER INTEGRATED MANUFACTURING; INTEGRATION; MONTE CARLO METHODS;

SURFACE INTEGRAL;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0027101112     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)