Uncertainty in photoluminescence-based effective carrier lifetime measurements

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2012, Pages 390-395

  Hameiri, Ziv ^a   McIntosh, Keith R ^b   Trupke, Thorsten ^c  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b PV Lighthouse ^*  (Australia)

^c UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

charge carrier density; charge carrier lifetime; photoluminescence; photovoltaic cells; silicon; uncertainty

Indexed keywords

BULK RESISTIVITY; CALIBRATION CONSTANTS; CARRIER LIFETIME MEASUREMENTS; DOPANT CONCENTRATIONS; EXCESS CARRIER CONCENTRATION; EXPERIMENTAL UNCERTAINTY; FRONT SURFACES; HIGH SENSITIVITY; INPUT PARAMETER; LIFETIME MEASUREMENTS; MEASUREMENT TECHNIQUES; MEASUREMENT UNCERTAINTY; UNCERTAINTY; WAFER THICKNESS;

CALIBRATION; CARRIER CONCENTRATION; CHARGE CARRIERS; PHOTOLUMINESCENCE; PHOTOVOLTAIC CELLS; SILICON; SILICON WAFERS;

UNCERTAINTY ANALYSIS;

EID: 84869450111     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2012.6317642     Document Type: Conference Paper

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