Self-consistent determination of the generation rate in photoluminescence and photoconductance lifetime measurements

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2005, Pages 899-902

  Bardos, R A ^a   Trupke, T ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; LIGHT ABSORPTION; PHOTOCONDUCTIVITY;

EFFECTIVE-LIFETIME MEASUREMENTS; GENERATION RATE; LIGHT INTENSITY;

PHOTOLUMINESCENCE;

EID: 27944454865     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. R.A. Sinton, A. Cuevas, and M. Stuckings, "Quasi-steady-state photoconductance, a new method for solar cell material and device characterization", 25th IEEE PVSC, 1996, pp. 457-460.
2. A. Cuevas and D. Macdonald, "Measuring and interpreting the lifetime of silicon wafers", Solar Energy 76, 2004, pp. 255-262.
3. D. Macdonald and A. Cuevas, "Trapping of minority carriers in multicrystalline silicon", Appl. Phys. Lett. 74, 1999, pp. 1710-1712.
4. P.J. Cousins, D.H. Neuhaus, and J.E. Cotter, "Experimental verification of the effect of depletion-region modulation on photoconductance lifetime measurements", J. Appl. Phys. 95, 2004, pp. 1854-1858.
5. M. Bail, M. Schulz, and R. Brendel, "Space-charge region-dominated steady-state photoconductance in low-lifetime silicon wafers", Appl. Phys. Lett. 82, 2003, pp. 757-759.
6. T. Trupke, et al., "Effective excess carrier lifetimes exceeding 100ms in float zone silicon determined from photoluminescence", 19th European Photovoltaic Solar Energy Conference, Paris, France June 2004.
7. T. Trupke and R. Bardos, "Photoluminescence: A surprisingly sensitive lifetime technique", this conference.
8. T. Trupke and R.A. Bardos, "Self-consistent determination of the generation rate from photoconductance measurements", Appl. Phys. Lett. 85, 2004, pp. 3611-3613.
9. H. Nagel, C. Berge, and A.G. Aberle, "Generalized analysis of quasi-steady-state and quasi-transient measurements of carrier lifetimes in semiconductors", J. Appl. Phys. 86, 1999, pp. 6218-6221.
10. R.A. Sinton and A. Cuevas, "Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data", Appl. Phys. Lett. 69, 1996, pp. 2510-2512.