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Volumn 14, Issue 46, 2012, Pages 16080-16087
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Water-mediated height artifacts in dynamic atomic force microscopy
c
EPFL
(Switzerland)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 84869390358
PISSN: 14639076
EISSN: None
Source Type: Journal
DOI: 10.1039/c2cp43031b Document Type: Article |
Times cited : (23)
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References (33)
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