Phase stability and initial low-temperature oxidation mechanism of Ti 2AlC thin films

Journal of the European Ceramic Society

Volumn 33, Issue 2, 2013, Pages 375-382

  Frodelius, Jenny ^a   Lu, Jun ^a   Jensen, Jens ^a   Paul, Dennis ^b   Hultman, Lars ^a   Eklund, Per ^a  

^a LINKÖPING UNIVERSITY   (Sweden)

^b Physical Electronics Inc Minnesota   (United States)

Author keywords

Carbides; Corrosion; Electron microscopy; Films; Interfaces

Indexed keywords

LOW TEMPERATURES; LOW-TEMPERATURE OXIDATION; OUT-OF-PLANE ORIENTATION; OXIDATION KINETICS; OXIDATION MECHANISMS; TIO; TITANIA;

ATOMS; CARBIDES; CORROSION; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; FILMS; INTERFACES (MATERIALS); MICROSTRUCTURE; OXIDATION; PHASE STABILITY; TEMPERATURE; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION;

ALUMINUM;

EID: 84868362627     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2012.09.003     Document Type: Article

References (50)

1. n phases: materials science and thin film processing. Thin Solid Films 2010, 518:1851-1878.
2. Wang J.Y., Zhou Y.C. Recent progress in theoretical prediction, preparation, and characterization of layered ternary transition-metal carbides. Annu Rev Mater Res 2009, 39:415-443.
3. N phases: a new class of solids; thermodynamically stable nanolaminates. Prog Solid State Chem 2000, 28:201-281.
4. Wilhelmsson O., Palmquist J.-P., Lewin E., Emmerlich J., Eklund P., Persson P.O.Å., et al. Deposition of ternary thin films within the Ti-Al-C system by dc magnetron sputtering. J Cryst Growth 2006, 291:290-300.
5. 2AlC. J Eur Ceram Soc 2012, 32:3485-3491.
6. 3: a new ternary carbide belonging to MAX phases in the Ti-Al-C system". J Am Ceram Soc 2012, 10.1111/j.1551-2916.2012.05299.x.
7. n phases in the Ti-Si-C system studied by thinfilm synthesis and ab initio calculations. Phys Rev B 2004, 70:165401.
8. 3 MAXphase thin films grown by magnetron sputtering. J Mater Res 2005, 20:779-782.
9. Högberg H., Hultman L., Emmerlich J., Joelsson T., Eklund P., Molina-Aldareguia J.M., et al. Growth and characterization of MAX-phase thin films. Surf Coat Technol 2005, 193:6-10.
10. 5 thin films synthesized by reactive sputter-deposition. Scripta Mater 2011, 65:811-814.
11. 2 ceramics: a review. J Mater Sci Technol 2010, 26:385-416.
12. 2. Corros Sci 2012, 58:95-103.
13. 2 at 1000-1400̊C in air. Corros Sci 2003, 45:891-907.
14. 2AlC ceramics". Scripta Mater 2011, 65:930-932.
15. 2AlC bulk and spray deposited coatings. Corros Sci 2010, 52:3955-3961.
16. 2AlC: on the origin of inhomogeneous oxide scale. Scripta Mater 2011, 65:135-138.
17. 2AlC. Acta Mater 2011, 59:5216-5223.
18. 2 between 1173 and 1473K in air. Mater Sci Eng A 2006, 434:147-154.
19. 2AlC in air. Oxid Met 2003, 59:303-320.
20. 2AlC at high temperature in air. Oxid Met 2007, 68:97-111.
21. Sundberg M., Malmqvist G., Magnusson A., El-Raghy T. Alumina forming high temperature silicides and carbides. Ceram Int 2004, 30:1899-1904.
22. 2 ceramics. Mater Chem Phys 2008, 112:762-768.
23. 2AlC ceramic. J Eur Ceram Soc 2012, 32:1813-1820.
24. 2AlC ceramics under an oxyacetylene flame. J Eur Ceram Soc 2011, 31:855-862.
25. 2AlC in air. J Mater Res 2002, 17:2974-2981.
26. 2 by preoxidation. Mat Res Innovat 2003, 7:381-390.
27. 2AlC phase. Corros Sci 2011, 53:2948-2955.
28. 2AlC. Thin Solid Films 2010, 518:1621-1626.
29. Reeber R.R., Wang K. Lattice parameters and thermal expansion of important semiconductors and their substrates. Mater Res Soc Symp 2000, 622:1-6. T6. 35.
30. Eklund P., Högberg H., Hultman L. Epitaxial TiC/SiC. Phys Stat Sol RRL 2007, 1:113-115.
31. 2AlC on steel. Thin Solid Films 2006, 515:389-393.
32. 2AlC coating prepared by sputtering at 370 and 500̊C. Surf Coat Technol 2010, 204:3838-3845.
33. Beckers M., Höglund C., Baehtz C., Martins R.M.S., Persson P.O.Å, Hultman L., et al. The influence of substrate temperature and Al mobility on the microstructural evolution of magnetron sputtered ternary Ti-Al-N thin films. J Appl Phys 2009, 106:064915.
34. 2GeC thin films. Phys Rev B 2011, 84:075424.
35. 2AlC. J Appl Phys 2011, 109:014903.
36. 2 substrates. J Cryst Growth 2007, 304:264-269.
37. 2 thin films. Acta Mater 2007, 55:1479-1488.
38. 2AlC. Acta Mater 2006, 54:1009-1015.
39. 2SnC) plate based on the electronic structure investigation. Mater Res Innovat 2000, 4:36-41.
40. x studied via electron energy-loss spectroscopy and first-principles calculations. Phys Rev B 2009, 80:092102.
41. 3 substrates. J Appl Phys 2008, 103:066102.
42. y compounds. Eur Ceram Soc 2012, 32:1803-1811.
43. Pang W.K., Low I.M. Diffraction study of thermal dissociation in the ternary Ti-Al-C system. J Aust Ceram Soc 2009, 45:30-33.
44. 2 upon heating in argon. Chem Mater 2003, 15:3716-3720.
45. 2AlC coating on Ti6242 alloy. Surf Coat Technol 2010, 204:2343-2352.
46. 2 and nc-TiC/a-SiC nanocomposite thin films. Phys Rev B 2006, 74:045417.
47. Jeurgens L.P.H., Sloof W.G., Tichelaar F.D., Mittemeijer E.J. Growth kinetics and mechanisms of aluminumoxide films formed by thermal oxidation of aluminum. J Appl Phys 2002, 92:1649-1656.
48. n (A: Si,Ge, Sn) thin films. J Mater Res 2007, 22:2279-2287.
49. 2AlC coatings. Int J Appl Ceram Technol 2011, 8:74-84.
50. Music D., Riley D.P., Schneider J.M. Energetics of point defects in TiC. J Eur Ceram Soc 2009, 29:773-777.