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Volumn 47, Issue 12, 2012, Pages 4257-4262

Roughness-based monitoring of transparency and conductivity in boron-doped ZnO thin films prepared by spray pyrolysis

Author keywords

A. Optical materials; A. Thin films; B. Chemical synthesis; C. X ray diffraction

Indexed keywords

BORON CONCENTRATIONS; BORON CONTENT; BORON-DOPED; CHEMICAL SYNTHESIS; ELECTRICAL RESISTIVITY; ELECTROOPTICAL PROPERTIES; POLYCRYSTALLINE ZNO; SOFT MODELING; SPHERICAL GRAINS; VISIBLE-WAVELENGTH RANGE; X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES; ZNO; ZNO FILMS; ZNO THIN FILM;

EID: 84868212746     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2012.09.022     Document Type: Article
Times cited : (28)

References (48)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.