X-ray diffraction studies of electrostatic sprayed SnO2:F films

Microelectronics Journal

Volumn 38, Issue 8-9, 2007, Pages 884-887

  Zaouk, D ^a   al Asmar, R ^b,d   Podlecki, J ^d   Zaatar, Y ^b   Khoury, A ^c   Foucaran, A ^d  

^a SAINT JOSEPH UNIVERSITY   (Lebanon)

^b HOLY SPIRIT UNIVERSITY OF KASLIK USEK   (Lebanon)

^c LEBANESE UNIVERSITY   (Lebanon)

^d UNIVERSITÉ MONTPELLIER II   (France)

Author keywords

Electrical measurements; Electrostatic spray pyrolysis; SnO2:F; Structural properties

Indexed keywords

FLUORINE; PYROLYSIS; TIN DIOXIDE; X RAY DIFFRACTION;

ELECTRICAL MEASUREMENTS; ELECTROSTATIC SPRAY PYROLYSIS; FLUORINE ATOMS;

ELECTROSTATICS;

EID: 34848893912     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2007.07.072     Document Type: Article

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