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Volumn 51, Issue 9 PART 2, 2012, Pages

Control of crystal structure of bifeo 3 epitaxial thin films by adjusting growth conditions and piezoelectric properties

(4) Kawahara, Yusaku a Ujimoto, Katsuya a Yoshimura, Takeshi a Fujimura, Norifumi a

a Osaka Prefecture University (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIFEO3 THIN FILM; ELECTROSTRICTIVE; EPITAXIAL STRAIN; EPITAXIAL THIN FILMS; GROWTH CONDITIONS; HIGH-VOLTAGES; LOW-VOLTAGE; PIEZOELECTRIC FORCE MICROSCOPY; PIEZOELECTRIC PROPERTY; PIEZOELECTRIC STRAIN; RECIPROCAL SPACE MAPPING; RHOMBOHEDRAL STRUCTURES; STRUCTURAL DISTORTIONS; TETRAGONAL DISTORTION;

CRYSTAL STRUCTURE; ELECTRIC FIELDS; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; FILM THICKNESS; GROWTH TEMPERATURE; PIEZOELECTRICITY; PULSED LASER DEPOSITION; THIN FILMS; X RAY DIFFRACTION;

FILM GROWTH;

EID: 84867774953 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.51.09LB04 Document Type: Conference Paper

Times cited : (14)

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