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Journal of Physics and Chemistry of Solids

Volumn 74, Issue 1, 2013, Pages 65-69

Influence of immersion cycles on the stoichiometry of CdS films deposited by SILAR technique

(3) Senthamilselvi, V a,b Ravichandran, K a Saravanakumar, K a

a A V V M SRI PUSHPAM COLLEGE (India)

b Kunthavai Naachiyaar Government College for Women (Autonomous) (India)

Author keywords

A. Chalcogenides; A. Semiconductors; A. Thin films; D. Optical properties; D. Surface properties

Indexed keywords

CDS FILMS; CRYSTALLINITIES; ENERGY DISPERSIVE X-RAY; IMMERSION CYCLES; NUMBER OF CYCLES; OPTICAL INVESTIGATION; SUCCESSIVE IONIC LAYER ADSORPTION AND REACTIONS; VISIBLE RANGE; X-RAY DIFFRACTION STUDIES;

ADSORPTION; CADMIUM COMPOUNDS; CADMIUM SULFIDE; CHALCOGENIDES; DEPOSITS; FILM PREPARATION; SURFACE PROPERTIES; X RAY DIFFRACTION;

STOICHIOMETRY;

EID: 84867669434 PISSN: 00223697 EISSN: None Source Type: Journal
DOI: 10.1016/j.jpcs.2012.07.020 Document Type: Article

Times cited : (36)

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