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Volumn 19, Issue 43, 2008, Pages
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Surface modification of CdS quantum dots using thiols - Structural and photophysical studies
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Author keywords
[No Author keywords available]
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Indexed keywords
AGENTS;
CADMIUM COMPOUNDS;
DATA STORAGE EQUIPMENT;
ENERGY GAP;
FLUORESCENCE;
GALLIUM ALLOYS;
LIGHT EMISSION;
LUMINESCENCE;
MICROSCOPIC EXAMINATION;
OPTICAL PROPERTIES;
OPTICAL WAVEGUIDES;
QUANTUM ELECTRONICS;
QUENCHING;
SEMICONDUCTOR QUANTUM DOTS;
X RAY ANALYSIS;
ABSORPTION WAVELENGTHS;
BAND GAPS;
BONDING MECHANISMS;
CAPPING AGENTS;
CDS QUANTUM DOTS;
DITHIOTHREITOL;
FLUORESCENCE PROPERTIES;
GLUTATHIONE;
GRAIN SIZES;
IN BANDS;
MERCAPTOETHANOL;
ORGANIC THIOLS;
PHOTOPHYSICAL;
PHOTOPHYSICAL STUDIES;
QUANTUM DOTS;
SEMI-CONDUCTORS;
SPECTROSCOPIC TECHNIQUES;
STRUCTURAL STUDIES;
SURFACE MODIFICATIONS;
SURFACE TRAPS;
UV-VISIBLE;
WET CHEMICALS;
X-RAY DIFFRACTIONS;
SEMICONDUCTING CADMIUM COMPOUNDS;
CADMIUM SULFIDE;
CYSTEINE;
DITHIOTHREITOL;
GLUTATHIONE;
MERCAPTOETHANOL;
METHIONINE;
QUANTUM DOT;
THIOL DERIVATIVE;
ARTICLE;
CHEMICAL ANALYSIS;
CHEMICAL STRUCTURE;
CRYSTAL STRUCTURE;
DIFFUSE REFLECTANCE SPECTROSCOPY;
ENERGY ABSORPTION;
FLUORESCENCE SPECTROSCOPY;
INFRARED SPECTROSCOPY;
NANOENCAPSULATION;
OPTICS;
PHOTOCHEMICAL QUENCHING;
PHOTOLUMINESCENCE;
POLARIMETRY;
PRIORITY JOURNAL;
SEMICONDUCTOR;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
THERMAL ANALYSIS;
TRANSMISSION ELECTRON MICROSCOPY;
ULTRAVIOLET SPECTROSCOPY;
X RAY DIFFRACTION;
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EID: 56349141695
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/19/43/435708 Document Type: Article |
Times cited : (97)
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References (42)
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