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Materials Science and Engineering: B

Volumn 174, Issue 1-3, 2010, Pages 145-149

Optical and structural properties of thermally evaporated cadmium sulphide thin films on silicon (1 0 0) wafers

(3) Khan, Ziaul Raza a Zulfequar, M a Khan, Mohd Shahid a

a JAMIA MILLIA ISLAMIA CENTRAL UNIVERSITY (India)

Author keywords

CdS; Ellipsometry; Energy band gap; Raman spectrum; Thermal evaporation; X ray diffraction (XRD)

Indexed keywords

CADMIUM SULFIDE; ENERGY GAP; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FOURIER TRANSFORMS; II-VI SEMICONDUCTORS; OPTOELECTRONIC DEVICES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION;

CADMIUM SULPHIDE THIN FILMS; ENERGY BANDGAPS; FOURIER TRANSFORM INFRARED; INDEX N; POLYCRYSTALLINE THIN FILM; THERMAL EVAPORATION TECHNIQUE; THICKNESS OF THE FILM; THIN-FILMS; X- RAY DIFFRACTIONS; X-RAY DIFFRACTION;

THERMAL EVAPORATION;

EID: 77956493533 PISSN: 09215107 EISSN: None Source Type: Journal
DOI: 10.1016/j.mseb.2010.03.006 Document Type: Conference Paper

Times cited : (161)

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