Nanocrystalline ZnSe thin films prepared by solution growth technique for photosensor application

Composites Part B: Engineering

Volumn 44, Issue 1, 2013, Pages 553-557

  Sadekar, Harishchandra K ^a   Ghule, Anil Vithal ^b   Sharma, Ramphal ^b  

^a Arts Commerce and Science College   (India)

^b DR BABASAHEB AMBEDKAR MARATHWADA UNIVERSITY   (India)

Author keywords

A. Thin films; B. Electrical properties; B. Optical properties; D. Surface analysis

Indexed keywords

AFM; ANALYSIS TECHNIQUES; AS-DEPOSITED THIN FILMS; COMPLEXING AGENTS; DEPOSITION PARAMETERS; ELEMENTAL COMPOSITIONS; ENERGY DISPERSIVE X-RAY; GLASS SUBSTRATES; HIGH TRANSMISSION; IV CHARACTERISTICS; NANOCRYSTALLINE GRAINS; NANOCRYSTALLINES; OPTICAL BAND GAP ENERGY; PHOTORESPONSES; PHOTOSENSOR; SOLUTION GROWTH TECHNIQUE; TRANSMISSION SPECTRUMS; TRIETHANOLAMINES; UNIFORM DEPOSITION; XRD PATTERNS; ZINC SELENIDE; ZNSE THIN FILMS;

DEPOSITS; ELECTRIC PROPERTIES; OPTICAL SENSORS; PHOTOSENSITIVITY; SUBSTRATES; SURFACE ANALYSIS; THIN FILMS;

VAPOR DEPOSITION;

EID: 84867550870     PISSN: 13598368     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.compositesb.2012.03.003     Document Type: Article

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