Optical properties of ZnSe and Zn0.87Mn0.13Se epilayers determined by spectroscopic ellipsometry

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 228-230

  Kvietkova, J ^a   Daniel, B ^a   Hetterich, M ^a   Schubert, M ^b   Spemann, D ^b  

^a UNIVERSITY OF KARLSRUHE   (Germany)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Critical points; Dielectric properties; ZnMnSe; ZnSe

Indexed keywords

ELLIPSOMETRY; OPTICAL PROPERTIES; OPTOELECTRONIC DEVICES; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS; SUBSTRATES; TERNARY SYSTEMS;

CRITICAL POINTS; EPILAYERS; ZNMNSE; ZNSE;

ZINC ALLOYS;

EID: 17144470497     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.11.201     Document Type: Conference Paper

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