Influence of thickness on the microstructural, optoelectronic and morphological properties of nanocrystalline ZnSe thin films

Materials Science and Engineering: B

Volumn 171, Issue 1-3, 2010, Pages 93-98

  Balu, A R ^a   Nagarethinam, V S ^a   Ahamed, M G Syed Basheer ^b   Thayumanavan, A ^b   Murali, K R ^c   Sanjeeviraja, C ^d   Swaminathan, V ^e   Jayachandran, M ^c  

^a A V V M SRI PUSHPAM COLLEGE   (India)

^b Government Arts and Science College   (India)

^c CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE   (India)

^d ALAGAPPA UNIVERSITY   (India)

^e NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Optical properties; Raman Scattering; Semiconductor; Thin film; Transmission electron microscopy

Indexed keywords

ENERGY GAP; FILM THICKNESS; GLASS SUBSTRATES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; II-VI SEMICONDUCTORS; NANOCRYSTALS; PHONONS; REFRACTIVE INDEX; SELENIUM COMPOUNDS; WIDE BAND GAP SEMICONDUCTORS;

150 ° C; DIFFERENT THICKNESS; GLASS SUBSTRATES; MICRO-STRUCTURAL PROPERTIES; MORPHOLOGICAL PROPERTIES; NANOCRYSTALLINES; OPTOELECTRONICS PROPERTY; THIN-FILMS; ZNSE FILMS; ZNSE THIN FILMS;

THIN FILMS;

EID: 77953325700     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2010.03.079     Document Type: Article

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