Synthesis of thermally evaporated ZnSe thin film at room temperature

Thin Solid Films

Volumn 519, Issue 18, 2011, Pages 5971-5977

  Khan, Taj Muhammad ^a   Mehmood, Muhammad Farhan ^b   Mahmood, Arshad ^a   Shah, A ^a   Raza, Q ^a   Iqbal, Amjid ^a   Aziz, U ^a  

^a National Institute of Lasers and Optronics   (Pakistan)

^b FEDERAL URDU UNIVERSITY OF ARTS   (Pakistan)

Author keywords

Ellipsometry; Photoluminescence; Raman spectroscopy; Semiconductors; Thermal evaporation; Thin films; Zinc selenide

Indexed keywords

AFM IMAGE; ATOMIC FORCE MICROSCOPES; BAND EMISSION; BAND GAPS; BEST FIT; ELLIPSOMETRIC DATA; FT-IR STUDY; GLASS SUBSTRATES; HIGH TRANSMISSION; HIGH VACUUM; INFRARED REGIONS; LONGITUDINAL OPTICAL PHONONS; LUMINESCENCE PEAK; POLYCRYSTALLINE; RAMAN SPECTROSCOPIC STUDY; ROOM TEMPERATURE; TRANSMISSION DATA; TRANSMITTANCE SPECTRA; WAVELENGTH REGIMES; ZINC BLENDE; ZINC SELENIDE; ZNSE FILMS; ZNSE THIN FILMS;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; DIFFRACTION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; IONIC LIQUIDS; OPTICAL CONSTANTS; PHASE TRANSITIONS; PHOTOLUMINESCENCE; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; SPECTROSCOPIC ANALYSIS; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION; X RAY DIFFRACTION; ZINC;

OPTICAL FILMS;

EID: 79958142092     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.03.045     Document Type: Article

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