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Volumn 209, Issue 10, 2012, Pages 2014-2019

Structural, electrical, and optical properties of thermally evaporated Ge-Te, Ge-Sb-Te, and Sb-Te thin films

Author keywords

chalcogenides; electrical properties; microstructure; optical properties; phase transitions; phase change materials

Indexed keywords

ANNEALED FILMS; AS-DEPOSITED FILMS; CRYSTALLINE FORM; CRYSTALLIZATION TEMPERATURE; DC ELECTRICAL CONDUCTIVITY; GE-SB-TE; OPTICAL CONTRAST; OPTICAL STUDY; PHASE-TRANSITION TEMPERATURE; POLY-CRYSTALLINE BULK; PREEXPONENTIAL FACTOR; PSEUDO-BINARIES; REFLECTANCE SPECTRUM; SHEET RESISTANCE MEASUREMENTS; TEMPERATURE DEPENDENT; TEMPERATURE RANGE; UV-VIS-NIR SPECTROSCOPY; WAVELENGTH RANGES; X-RAY DIFFRACTION STUDIES; XRD;

EID: 84867492634     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201228053     Document Type: Article
Times cited : (14)

References (36)
  • 32
    • 0004132773 scopus 로고
    • J. Tauc (ed.), (Plenum Press, New York).
    • J. Tauc, (ed.), Amorphous and Liquid Semiconductors (Plenum Press, New York, 1974).
    • (1974) Amorphous and Liquid Semiconductors


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.