-
3
-
-
0002649704
-
-
10.1088/0034-4885/23/1/301 0034-4885
-
Heavens O S 1960 Rep. Prog. Phys. 23 1-65
-
(1960)
Rep. Prog. Phys.
, vol.23
, Issue.1
, pp. 1-65
-
-
Heavens, O.S.1
-
6
-
-
85075522471
-
Interferometer for measurement of absolute refractive index and thickness
-
Aleksandrov A and Chernyh I V 1992 Interferometer for measurement of absolute refractive index and thickness Proc. SPIE 1756 221-6
-
(1992)
Proc. SPIE
, vol.1756
, pp. 221-226
-
-
Aleksandrov, A.1
Chernyh, I.V.2
-
15
-
-
0343022269
-
Thickness dependence of the optical properties of sputter deposited Ti oxide films
-
DOI 10.1016/S0040-6090(99)01109-8
-
Rodrigue J, Gómez M, Ederth J, Niklasson G A and Granqvist C G 2000 Thin Solid Films 365 119-25 (Pubitemid 30587689)
-
(2000)
Thin Solid Films
, vol.365
, Issue.1
, pp. 119-125
-
-
Rodriguez, J.1
Gomez, M.2
Ederth, J.3
Niklasson, G.A.4
Granqvist, C.G.5
-
16
-
-
0034268817
-
-
PART 1 10.1143/JJAP.39.5139 0021-4922
-
Bie Q, Cheong B, Chung M, Lin Z, Sung Lee T, Kim W M and Kim S G 2000 Japan. J. Appl. Phys. 39 5139-43
-
(2000)
Japan. J. Appl. Phys.
, vol.39
, Issue.9 A
, pp. 5139-5143
-
-
Bie, Q.1
Cheong, B.2
Chung, M.3
Lin, Z.4
Sung Lee, T.5
Kim, W.M.6
Kim, S.G.7
-
18
-
-
34250875323
-
Band-gap determination from diffuse reflectance measurements of semiconductor films, and application to photoelectrochemical water-splitting
-
DOI 10.1016/j.solmat.2007.05.005, PII S0927024807001948
-
Murphy A B 2007 Sol. Energy Mater. Sol. Cells 91 1326-37 (Pubitemid 46990866)
-
(2007)
Solar Energy Materials and Solar Cells
, vol.91
, Issue.14
, pp. 1326-1337
-
-
Murphy, A.B.1
-
19
-
-
0018012160
-
-
10.1364/AO.17.002779 0003-6935
-
Goodman A M 1978 Appl. Opt. 17 2779-87
-
(1978)
Appl. Opt.
, vol.17
, Issue.17
, pp. 2779-2787
-
-
Goodman, A.M.1
-
21
-
-
84975604880
-
-
10.1364/AO.24.000504 0003-6935
-
Chang M and Gibson U J 1985 Appl. Opt. 24 504-7
-
(1985)
Appl. Opt.
, vol.24
, Issue.4
, pp. 504-507
-
-
Chang, M.1
Gibson, U.J.2
-
23
-
-
33745485676
-
The effect of annealing on structural and optical properties of ZnO thin films grown by pulsed filtered cathodic vacuum arc deposition
-
DOI 10.1088/0953-8984/18/27/021, PII S095389840623443X, 021
-
Senadim E, Kavak H and Esen R 2006 J. Phys.: Condens. Mater 18 6391-400 (Pubitemid 43959255)
-
(2006)
Journal of Physics Condensed Matter
, vol.18
, Issue.27
, pp. 6391-6400
-
-
Senadim, E.1
Kavak, H.2
Esen, R.3
-
25
-
-
33746795396
-
Optical and structural parameters of the ZnO thin film grown by pulsed filtered cathodic vacuum arc deposition
-
DOI 10.1016/j.ssc.2006.07.001, PII S0038109806005771
-
Senadim E, Eker S, Kavak H and Esen R 2006 Solid State Commun. 139 479-84 (Pubitemid 44177786)
-
(2006)
Solid State Communications
, vol.139
, Issue.9
, pp. 479-484
-
-
Senadim, E.1
Eker, S.2
Kavak, H.3
Esen, R.4
-
28
-
-
0026825233
-
-
10.1143/JJAP.31.768 0021-4922
-
Maley N 1992 Japan. J. Appl. Phys. 31 768-9
-
(1992)
Japan. J. Appl. Phys.
, vol.31
, Issue.3 PART 1
, pp. 768-769
-
-
Maley, N.1
-
31
-
-
43049129663
-
-
0022-3727 035308
-
Deshpande N G, Gudage Y G, Ghosh A, Vyas J C, Singh F, Tripathi A and Sharma R 2008 J. Phys. D: Appl. Phys. 41 035308
-
(2008)
J. Phys. D: Appl. Phys.
, vol.41
, Issue.3
-
-
Deshpande, N.G.1
Gudage, Y.G.2
Ghosh, A.3
Vyas, J.C.4
Singh, F.5
Tripathi, A.6
Sharma, R.7
-
38
-
-
33847596250
-
-
10.1103/PhysRevB.27.985 0163-1829 B
-
Aspnes D E and Studna A A 1983 Phys. Rev. B 27 985-1009
-
(1983)
Phys. Rev.
, vol.27
, Issue.2
, pp. 985-1009
-
-
Aspnes, D.E.1
Studna, A.A.2
-
39
-
-
0038143306
-
-
10.1063/1.1573737 0021-8979
-
Jellison G E, Boatner L A, Budai J D, Jeong B-S and Norton D P 2003 J. Appl. Phys. 93 9537-41
-
(2003)
J. Appl. Phys.
, vol.93
, Issue.12
, pp. 9537-9541
-
-
Jellison, G.E.1
Boatner, L.A.2
Budai, J.D.3
Jeong, B.-S.4
Norton, D.P.5
-
42
-
-
80052305869
-
-
Cesaria M, Caricato A P, Leggieri G, Luches A, Martino M, Maruccio G, Catalano M, Manera M G, Rella R and Taurino A 2011 J. Phys. D: Appl. Phys. 44 365
-
(2011)
J. Phys. D: Appl. Phys.
, vol.44
, pp. 365
-
-
Cesaria, M.1
Caricato, A.P.2
Leggieri, G.3
Luches, A.4
Martino, M.5
Maruccio, G.6
Catalano, M.7
Manera, M.G.8
Rella, R.9
Taurino, A.10
-
44
-
-
71649087037
-
-
10.1016/j.tsf.2009.05.056 0040-6090
-
Giusti G, Tian L, Jones I P, Abell J S and Bowen J 2009 Thin Solid Films 518 1140-4
-
(2009)
Thin Solid Films
, vol.518
, Issue.4
, pp. 1140-1144
-
-
Giusti, G.1
Tian, L.2
Jones, I.P.3
Abell, J.S.4
Bowen, J.5
-
45
-
-
78650607185
-
-
10.1007/s00339-010-5988-2 0947-8396 A
-
Caricato A P et al 2010 Appl. Phys. A 101 753
-
(2010)
Appl. Phys.
, vol.101
, Issue.4
, pp. 753
-
-
Caricato, A.P.1
-
48
-
-
28844449313
-
-
10.1016/j.ssc.2005.10.012 0038-1098
-
Kim H S, Hwa Ji S, Kim H, Hong S, Kim D, Ihm Y E and Choo W K 2005 Solid State Commun. 137 41
-
(2005)
Solid State Commun.
, vol.137
, Issue.1-2
, pp. 41
-
-
Kim, H.S.1
Hwa Ji, S.2
Kim, H.3
Hong, S.4
Kim, D.5
Ihm, Y.E.6
Choo, W.K.7
|