Optical constants measurement of single-layer thin films on transparent substrates

Optics Communications

Volumn 158, Issue 1-6, 1998, Pages 221-230

  Penzkofer, A ^a   Drotleff, E ^a   Holzer, W ^a  

^a UNIVERSITY OF REGENSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTROMAGNETIC DISPERSION; FUSED SILICA; LIGHT ABSORPTION; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT TRANSMISSION; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; THIN FILMS;

OPTICAL CONSTANTS MEASUREMENT;

OPTICAL FILMS;

EID: 0032291655     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(98)00535-5     Document Type: Article

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