Determination of the thickness and optical constants of thin films from transmission spectra

Thin Solid Films

Volumn 286, Issue 1-2, 1996, Pages 164-169

  Kubinyi, M ^a   Benko N ^a   Grofcsik, A ^a   Jones, W Jeremy ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b SWANSEA UNIVERSITY   (United Kingdom)

Author keywords

Amorphous materials; Optical properties; Optical spectroscopy; Silicon

Indexed keywords

ALGORITHMS; AMORPHOUS MATERIALS; CALCULATIONS; LIGHT INTERFERENCE; LIGHT TRANSMISSION; MONTE CARLO METHODS; OPTICAL FILMS; REFRACTIVE INDEX;

INTERFERENCE PATTERNS; MARQUARDT ALGORITHM; MONTE CARLO SIMULATION; THIN OPTICAL FILMS; TRANSMISSION SPECTRA;

THIN FILMS;

EID: 0030232152     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08737-8     Document Type: Article

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