Determination of optical constants of thin films from measurements of reflectance and transmittance

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 9 A, 2000, Pages 5139-5143

  Bie, Qingshan ^a,b,c   Cheong, Byung Ki ^a   Chung, Moonkyo ^a   Lin, Zhensu ^d   Lee, Taek Sung ^a   Kim, Won Mok ^a   Kim, Soon Gwang ^a  

^a Korea Institute of Science and Technology   (South Korea)

^b NANJING UNIVERSITY   (China)

^c Architectural and Environmental Engineering   (United States)

^d MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM PREPARATION; LEAST SQUARES APPROXIMATIONS; MULTILAYERS; OPACITY; REFLECTION; THICKNESS MEASUREMENT;

OPTICAL CONSTANTS;

THIN FILMS;

EID: 0034268817     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.5139     Document Type: Article

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