Time dependent dielectric breakdown physics - Models revisited

Microelectronics Reliability

Volumn 52, Issue 9-10, 2012, Pages 1753-1760

  McPherson, J W ^a  

^a McPherson Reliability Consulting LLC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC DEGRADATION; FIELD-INDUCED; MOLECULAR LEVELS; PERCOLATION PATH; TIME-DEPENDENT DIELECTRIC BREAKDOWN;

SILICA;

DIELECTRIC MATERIALS;

EID: 84866735471     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2012.06.007     Document Type: Article

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