Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Volumn , Issue , 2009, Pages 1-624

  Strong, Alvin W ^a   Wu, Ernest Y ^a   Vollertsen, Rolf Peter ^a   Suñé, Jordi ^a   La Rosa, Giuseppe ^a   Rauch, Stewart E ^a   Sullivan, Timothy D ^a  

^a IEEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84889279030     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9780470455265     Document Type: Book

References (0)