An investigation of the surface properties of (Ag,Cu)(In,Ga)Se 2 thin films

IEEE Journal of Photovoltaics

Volumn 2, Issue 4, 2012, Pages 519-523

  Simchi, H ^a,b   McCandless, B E ^b   Kim, K ^b   Boyle, J H ^a,b   Birkmire, R W ^a,b   Shafarman, W N ^a,b  

^a UNIVERSITY OF DELAWARE   (United States)

^b UNIVERSITY OF DELAWARE   (United States)

Author keywords

Copper indium galium selenide (CIGS); solar cells; surface characterization; thin film

Indexed keywords

ABSORBER LAYERS; BULK COMPOSITIONS; COPPER-INDIUM-GALIUM-SELENIDE (CIGS); ELEMENTAL EVAPORATION; ENERGY DISPERSIVE X RAY SPECTROSCOPY; GLANCING INCIDENCE X-RAY DIFFRACTIONS; MULTISOURCES; NEAR SURFACE REGIONS; ORDERED DEFECT COMPOUNDS; SURFACE CHARACTERIZATION;

COPPER; COPPER COMPOUNDS; GALLIUM; GALLIUM ALLOYS; PHOTOELECTRONS; SEMICONDUCTING SELENIUM COMPOUNDS; SILVER ALLOYS; SOLAR CELLS; SURFACE DEFECTS; SURFACE PROPERTIES; THIN FILMS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

SILVER;

EID: 84866732689     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2012.2204391     Document Type: Article

References (14)

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