Crystal structure of CuIn3Se5 semiconductor studied using electron and X-ray diffractions

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 36, Issue 11 SUPPL. B, 1997, Pages

  Hanada, Takeshi ^a   Yamana, Azusa ^a   Nakamura, Yoshio ^a   Nittono, Osamu ^a   Wada, Takahiro ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b PANASONIC CORPORATION   (Japan)

Author keywords

Convergent beam electron diffraction; Crystal symmetry; CuIn3Se5; CuInSe2 (CIS); Space group; X ray diffraction

Indexed keywords

ATOMS; CHEMICAL BONDS; CRYSTAL SYMMETRY; ELECTRON DIFFRACTION; ELECTRONS; LATTICE CONSTANTS; X RAY CRYSTALLOGRAPHY;

CONVERGENT BEAM ELECTRON DIFFRACTION;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0031271005     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l1494     Document Type: Article

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