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Volumn 64, Issue 1-3, 1998, Pages 55-60

Effect of CuIn3Se5 layer thickness on CuInSe2 thin films and devices

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; AUGER ELECTRON SPECTROSCOPY; COPPER COMPOUNDS; EVAPORATION; FILM GROWTH; INTERFACES (MATERIALS); THIN FILM DEVICES; X RAY DIFFRACTION ANALYSIS;

EID: 0032172776     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-092X(98)00024-3     Document Type: Article
Times cited : (31)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.