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Volumn 64, Issue 1-3, 1998, Pages 55-60
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Effect of CuIn3Se5 layer thickness on CuInSe2 thin films and devices
a a a b b |
Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION;
AUGER ELECTRON SPECTROSCOPY;
COPPER COMPOUNDS;
EVAPORATION;
FILM GROWTH;
INTERFACES (MATERIALS);
THIN FILM DEVICES;
X RAY DIFFRACTION ANALYSIS;
SEQUENTIAL CO-EVAPORATION;
SOLAR CELLS;
SOLAR POWER;
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EID: 0032172776
PISSN: 0038092X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-092X(98)00024-3 Document Type: Article |
Times cited : (31)
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References (8)
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