End to end modeling for variability and reliability analysis of thin film photovoltaics

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2012, Pages

  Dongaonkar, Sourabh ^a   Alam, Muhammad A ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

modeling and simulation; partial shadow; reliability; shunt; thin film PV; variability

Indexed keywords

ARRAY CONFIGURATIONS; CELL SURFACES; END TO END; END-TO-END SIMULATION; INTEGRATED ANALYSIS; LOG-NORMAL; MODELING AND SIMULATION; MODELING FRAMEWORKS; MODULE EFFICIENCY; PARTIAL SHADOW; PHYSICS-BASED; PROCESS YIELD; SHUNT; SYSTEM LEVELS; THIN FILM MODULES; THIN FILM PHOTOVOLTAICS; VARIABILITY;

CELL MEMBRANES; COMPUTER SIMULATION; NORMAL DISTRIBUTION; PHOTOVOLTAIC CELLS; RELIABILITY; RELIABILITY ANALYSIS;

THIN FILMS;

EID: 84866603857     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2012.6241828     Document Type: Conference Paper

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