Identification, characterization, and implications of shadow degradation in thin film solar cells

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

  Dongaonkar, Sourabh ^a   Alam, Muhammad A ^a   Karthik, Y ^b   Mahapatra, Souvik ^b   Wang, Dapeng ^c   Frei, Michel ^c  

^a PURDUE UNIVERSITY   (United States)

^b INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^c APPLIED MATERIALS INC   (United States)

Author keywords

performance degradation; reliability; Thin film solar cells; voltage stress

Indexed keywords

A-SI:H; COMPREHENSIVE STUDIES; CURRENT DEGRADATION; DEGRADATION PROCESS; OPERATING LIFETIME; P-I-N CELLS; PERFORMANCE DEGRADATION; PHOTOVOLTAIC PANELS; REVERSE BIAS; STATISTICAL DISTRIBUTION; THIN FILM SOLAR CELLS; VOLTAGE STRESS;

DARK CURRENTS; DIFFUSERS (OPTICAL); PHOTOVOLTAIC EFFECTS; RELIABILITY; SOLAR POWER GENERATION; THIN FILMS;

DEGRADATION;

EID: 79959295772     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2011.5784535     Document Type: Conference Paper

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