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Volumn 116, Issue 36, 2012, Pages 19215-19224

Probing the energetic distribution of injected electrons at quantum dot-linker-TiO 2 interfaces

Author keywords

[No Author keywords available]

Indexed keywords

BAND EDGE; CDSE QUANTUM DOTS; INJECTED ELECTRONS; INTERFACIAL ELECTRON TRANSFER; LOWER ENERGIES; TIME-RESOLVED EMISSIONS; TIME-SCALES; TIO; TRAP STATE; TRAPPED CARRIERS;

EID: 84866376659     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp307196z     Document Type: Article
Times cited : (14)

References (83)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.