Multiple-stress model for one-shot device testing data under exponential distribution

IEEE Transactions on Reliability

Volumn 61, Issue 3, 2012, Pages 809-821

  Balakrishnan, Narayanaswamy ^a   Ling, Man Ho ^a  

^a MCMASTER UNIVERSITY   (Canada)

Author keywords

Asymptotic method; binary data; confidence intervals; expectation maximization algorithm; exponential distribution; jackknife; least squares method; multiple stress model; one shot device; parametric bootstrap; point estimation

Indexed keywords

ASYMPTOTIC METHOD; BINARY DATA; CONFIDENCE INTERVAL; EXPECTATION-MAXIMIZATION ALGORITHMS; EXPONENTIAL DISTRIBUTIONS; JACKKNIFE; LEAST SQUARES METHODS; ONE-SHOT DEVICE; PARAMETRIC BOOTSTRAP; POINT ESTIMATION;

EXPERIMENTS; FISHER INFORMATION MATRIX; INFERENCE ENGINES; MAXIMUM LIKELIHOOD ESTIMATION; NEWTON-RAPHSON METHOD;

ALGORITHMS;

EID: 84865719205     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2012.2208301     Document Type: Article

References (36)

1. S. W. Yates and A. Mosleh, "A Bayesian approach to reliability demonstration for aerospace systems," Reliability and Maintainability Symposium, pp. 611-617, 2006. (Pubitemid 46900334)
2. T. H. Fan, N. Balakrishnan, and C. C. Chang, "The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing," Journal of Statistical Computation and Simulation, vol. 79, pp. 1143-1154, 2009.
3. M. Newby, "Monitoring and maintenance of spares and one shot devices," Reliability Engineering and System Safety, vol. 93, pp. 588-594, 2008. (Pubitemid 350235200)
4. N. Balakrishnan and M. H. Ling, "EM algorithm for one-shot device testing under the exponential distribution," Computational Statistics & Data Analysis, vol. 56, pp. 502-509, 2012.
5. M. B. Srinivas and T. S. Ramu, "Multifactor aging of HV generator stator insulation including mechanical vibrations," IEEE Trans. Electrical Insulation, vol. 27, pp. 1009-1021, 1992.
6. A. M. Bruning and F. J. Campbell, "Aging in wire insulation under multifactor stress," IEEE Trans. Electrical Insulation, vol. 28, pp. 729-754, 1993.
7. R. Bartnikas and R. Morin, "Multi-stress aging of stator bars with electrical, thermal, and mechanical stresses as simultaneous acceleration factors," IEEE Trans. Energy Conversion, vol. 19, pp. 702-714, 2004.
8. E. Noguirea, M. Vázquez, and N. Núñez, "Evaluation of AlGaInP LEDs reliability based on accelerated tests," Mircoelectronics Reliability, vol. 49, pp. 1240-1243, 2009.
9. J. Virkki, T. Seppälä, L. Frisk, and P. Heino, "Accelerated testing for failures of tantalum capacitors," Mircoelectronics Reliability, vol. 50, pp. 217-219, 2010.
10. S. C. Yang, P. Lin, C. P. Wang, S. B. Huang, C. L. Chen, P. F. Chiang, A. T. Lee, and M. T. Chu, "Failure and degradation mechanisms of high power while light emitting diodes," Mircoelectronics Reliability, vol. 50, pp. 959-964, 2010.
11. M. Vázquez, N. Núñez, E. Noguirea, and A. Borreguero, "Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests," Mircoelectronics Reliability, vol. 50, pp. 1559-1562, 2010.
12. R. V. Craiu and T. Duchesne, "Inference based on the EMalgorithm for the competing risks model with masked causes of failure," Biometrika, vol. 91, pp. 543-558, 2004. (Pubitemid 41309892)
13. J. A. Aguilar and J. J. Hernández-Rey, "The expectation-maximization algorithm applied to the search of point sources of astroparticles," Astroparticle Physics, vol. 29, pp. 117-124, 2008.
14. A. G. Murta and C. Vendrell, "Using the EM algorithm to age fish eggs," ICES Journal of Marine Science, vol. 66, pp. 607-616, 2009.
15. N. M. Laird, "The EM algorithm in genetics, genomics and public health," Statistical Science, vol. 25, pp. 450-457, 2010.
16. G. J. McLachlan and T. Krishnan, The EM Algorithm and Extensions, Second ed. Hoboken, New Jersey: John Wiley & Sons, 2008.
17. T. A. Louis, "Finding the observed information matrix when using the EM algorithm," Journal of the Royal Statistical Society, Series B, vol. 44, pp. 226-233, 1982.
18. H. K. T. Ng, P. S. Chan, and N. Balakrishnan, "Estimation of parameters from progressively censored data using EM algorithm," Computational Statistics & Data Analysis, vol. 39, pp. 371-386, 2002. (Pubitemid 34735882)
19. S. Nandi and I. Dewan, "An EM algorithm for estimating the parameters of bivariate Weibull distribution under random censoring," Computational Statistics & Data Analysis, vol. 54, pp. 1559-1569, 2010.
20. A. P. Dempster, N. M. Laird, and D. B. Rubin, "Maximum likelihood from incomplete data via the EMalgorithm (with discussion)," Journal of the Royal Statistical Society, Series B, vol. 39, pp. 1-38, 1977.
21. D. Oakes, "Direct calculation of the information matrix via the EM algorithm," Journal of the Royal Statistical Society, Series B, vol. 61, pp. 479-482, 1999.
22. H. Friedl and G. Kauermann, "Standard errors for EM estimates in generalized linear models with random effects," Biometrics, vol. 56, pp. 761-767, 2000.
23. R. Davidson, "Reliable inference for the Gini index," Journal of Econometrics, vol. 150, pp. 30-40, 2009.
24. S. Patil and D. J. Lilja, "Using resampling techniques to compute confidence intervals for the harmonic mean of rate-based performance metrics," IEEE Computer Architecture Letters, vol. 9, pp. 1-4, 2010.
25. W. Q. Meeker and L. A. Escobar, Statistical Methods for Reliability Data. New York: John Wiley & Sons, 1998.
26. D. D. Hanagal, "BivariateWeibull regression model based on censored samples," Statistical Papers, vol. 47, pp. 137-138, 2005.
27. M. S. Wulfsohn and A. A. Tsiatis, "A joint model for survival and longitudinal data measured with error," Biometrics, vol. 53, pp. 330-339, 1997. (Pubitemid 27131905)
28. G. Pulcini, "A bounded intensity process for the reliability of repairable equipment," Journal of Quality Technology, vol. 33, pp. 480-492, 2001.
29. Y. M. M. Bishop, S. E. Feinberg, and P. W. Holland, Discrete Multivariate Analysis: Theory and Practice. Cambridge:MIT Press, 1975.
30. B. Efron, "Nonparametric standard errors and confidence intervals," The Canadian Journal of Statistics, vol. 9, pp. 139-158, 1981.
31. B. Efron, The Jackknife, the Bootstrap and Other Resampling Plans. Philadelphia: SIAM, 1982.
32. N. Balakrishnan, E. Beutner, and U. Kamps, "Order restricted inference for sequential k-out-of-n systems," Journal of Multivariate Analysis, vol. 99, pp. 1489-1502, 2008.
33. N. Balakrishnan, E. Beutner, andM. Kateri, "Order restricted inference for exponential step-stress models," IEEE Trans. Reliability, vol. 58, pp. 132-142, 2009.
34. S. Y. Sohn, "Accelerated life tests for intermittent destructive inspection with logistic failure distribution," IEEE Trans. Reliability, vol. 46, pp. 122-129, 1997. (Pubitemid 127762160)
35. N. L. Johnson, S. Kotz, and N. Balakrishnan, Continuous Univariate Distributions - Volume 1, Second ed. New York: JohnWiley & Sons, 1994.
36. N. L. Johnson, S. Kotz, and N. Balakrishnan, Continuous Univariate Distributions - Volume 2, Second ed. New York: JohnWiley & Sons, 1995.