Accelerated life-tests for intermittent destructive inspection, with logistic failure-distribution

IEEE Transactions on Reliability

Volumn 46, Issue 1, 1997, Pages 122-129

  Sohn, So Young ^a  

^a Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EQUIPMENT TESTING; FAILURE ANALYSIS; INSPECTION; MISSILES; SERVICE LIFE; STATISTICAL TESTS;

ACCELERATED LIFE TESTING (ALT); INTERMITTENT DESTRUCTIVE INSPECTIONS; LOGISTIC FAILURE DISTRIBUTION; MAXIMUM LIKELIHOOD (ML) ESTIMATORS;

AGING OF MATERIALS;

EID: 0031097566     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.589937     Document Type: Article

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