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Volumn 98, Issue , 2012, Pages 206-209

Local ion irradiation of thin graphene films grown on SiC substrates

b CNRS (France)

Author keywords

FIB; Graphene; Nanopatterning; Surface defects

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; DOSE CONTROL; FIB; ION DOSE; NANOPATTERNING; SIC SUBSTRATES; SURFACE PATTERNING; TUNABLE TEMPLATES;

ATOMIC FORCE MICROSCOPY; ELECTRONIC PROPERTIES; GALLIUM ALLOYS; IONS; IRRADIATION; RAMAN SPECTROSCOPY; SILICON CARBIDE; SURFACE DEFECTS;

GRAPHENE;

EID: 84865609782 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/j.mee.2012.07.025 Document Type: Conference Paper

Times cited : (6)

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