SCOPUS 정보 검색 플랫폼

Superlattices and Microstructures

Volumn 52, Issue 4, 2012, Pages 765-773

Effects of Ti-doped concentration on the microstructures and optical properties of ZnO thin films

(8) Liu, J a Ma, S Y a Huang, X L a Ma, L G a Li, F M a Yang, F C a Zhao, Q a Zhang, X L a

a NORTHWEST NORMAL UNIVERSITY (China)

Author keywords

Optical properties; RF magnetron sputtering; X ray diffraction; ZnO:Ti thin films

Indexed keywords

BLUE SHIFT; CRYSTALLINE STRUCTURE; DIFFRACTION PEAKS; EMISSION PEAKS; FLUORESCENCE SPECTROPHOTOMETER; GLASS SUBSTRATES; HEXAGONAL WURTZITE; PHOTOLUMINESCENCE SPECTRUM; PREFERENTIAL ORIENTATION; PURE ZNO; RADIO FREQUENCIES; REACTIVE MAGNETRON SPUTTERING; RF-MAGNETRON SPUTTERING; ROOM TEMPERATURE; SCANNING ELECTRONIC MICROSCOPY; SMOOTH SURFACE; TI ATOMS; TI CONTENT; TI DOPING; VISIBLE WAVELENGTHS; XRD MEASUREMENTS; ZNO; ZNO THIN FILM;

MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SUBSTRATES; THIN FILMS; TITANIUM; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

SEMICONDUCTOR DOPING;

EID: 84864807829 PISSN: 07496036 EISSN: 10963677 Source Type: Journal
DOI: 10.1016/j.spmi.2012.06.021 Document Type: Article

Times cited : (56)

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