Applying PSO and OCBA to minimize the overkills and re-probes in wafer probe testing

IEEE Transactions on Semiconductor Manufacturing

Volumn 25, Issue 3, 2012, Pages 531-540

  Horng, Shih Cheng ^a   Yang, Feng Yi ^b   Lin, Shieh Shing ^c  

^a CHAOYANG UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b NATIONAL YANG MING UNIVERSITY   (Taiwan)

^c ST JOHN'S UNIVERSITY   (Taiwan)

Author keywords

Multiobjective optimization; optimal computing budget allocation (OCBA); overkill; particle swarm optimization (PSO); re probe; wafer probe testing

Indexed keywords

COMPUTATIONAL TIME; EVOLUTION STRATEGIES; FITNESS EVALUATIONS; MODEL-BASED OPC; MULTI-OBJECTIVE OPTIMIZATION PROBLEM; OPTIMAL COMPUTING BUDGET ALLOCATION; OPTIMAL SETTING; OVERKILL; PSO ALGORITHMS; RE-PROBE; SEMICONDUCTOR PRODUCTS; SOLUTION QUALITY; STOCHASTIC SIMULATIONS; TEST WAFERS; TWO-STAGE ALGORITHM; WAFER PROBES;

ALGORITHMS; BUDGET CONTROL; COMPUTATIONAL EFFICIENCY; MULTIOBJECTIVE OPTIMIZATION; PARTICLE SWARM OPTIMIZATION (PSO); SILICON WAFERS; STOCHASTIC MODELS;

PROBES;

EID: 84864711142     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2012.2200266     Document Type: Article

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