Application of an ordinal optimization algorithm to the wafer testing process

IEEE Transactions on Systems, Man, and Cybernetics Part A:Systems and Humans

Volumn 36, Issue 6, 2006, Pages 1229-1234

  Lin, Shin Yeu ^a   Horng, Shih Cheng ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Genetic algorithm (GA); Neural network; Ordinal optimization (OO); Overkill; Retest; Stochastic optimization; Water probing

Indexed keywords

GENETIC ALGORITHMS; OPTIMIZATION; PARETO PRINCIPLE; RANDOM PROCESSES; THRESHOLD LOGIC;

ORDINAL OPTIMIZATION; STOCHASTIC OPTIMIZATION; WAFER TESTING;

NEURAL NETWORKS;

EID: 33750592257     PISSN: 10834427     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCA.2006.878965     Document Type: Article

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