Silk layering as studied with neutron reflectivity

Langmuir

Volumn 28, Issue 31, 2012, Pages 11481-11489

  Wallet, Brett ^a   Kharlampieva, Eugenia ^a   Campbell Proszowska, Katie ^a   Kozlovskaya, Veronika ^a   Malak, Sidney ^a   Ankner, John F ^b   Kaplan, David L ^c   Tsukruk, Vladimir V ^a  

^a Georgia Institute of Technology   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c Tufts University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOMBYX MORI SILK FIBROIN; DIRECT CONTACT; EFFECTIVE THICKNESS; INITIAL THICKNESS; LAYERED STRUCTURES; LIQUID ENVIRONMENT; LIQUID-SOLID INTERFACES; NANO-BUBBLE; NANO-FIBRILS; NANOFIBRILLAR; NANOPOROUS MORPHOLOGIES; NEUTRON REFLECTIVITY; RANDOM COIL; SCATTERING LENGTH DENSITY; SECONDARY STRUCTURES; SILICON OXIDE SURFACES; SILICON SUBSTRATES; SILK FILM; SPIN-ASSISTED LAYER-BY-LAYER; STRUCTURAL ORGANIZATION; SURFACE FILMS; SURFACE LAYERS; ULTRA-THIN; VERTICAL SEGREGATION;

ATOMIC FORCE MICROSCOPY; LIQUIDS; MONOLAYERS; MORPHOLOGY; MULTILAYER FILMS; PHASE INTERFACES; REFLECTION; SILICON OXIDES; SURFACE SEGREGATION; ULTRATHIN FILMS;

SILK;

FIBROIN; NANOFIBER; SILICON; WATER;

ANIMAL; ARTICLE; ATOMIC FORCE MICROSCOPY; BIOSYNTHESIS; BOMBYX; CHEMICAL PHENOMENA; CHEMISTRY; CRYSTALLIZATION; ELECTROCHEMICAL ANALYSIS; ISOLATION AND PURIFICATION; LARVA; NEUTRON DIFFRACTION; PHYSIOLOGY; PROTEIN SECONDARY STRUCTURE; SMALL ANGLE SCATTERING; SURFACE PROPERTY; ULTRASTRUCTURE;

ANIMALS; BOMBYX; CRYSTALLIZATION; ELECTROCHEMICAL TECHNIQUES; FIBROINS; HYDROPHOBIC AND HYDROPHILIC INTERACTIONS; LARVA; MICROSCOPY, ATOMIC FORCE; NANOFIBERS; NEUTRON DIFFRACTION; PROTEIN STRUCTURE, SECONDARY; SCATTERING, SMALL ANGLE; SILICON; SURFACE PROPERTIES; WATER;

EID: 84864692428     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la300916e     Document Type: Article

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