Substrate-induced disorder in V 2O 3 thin films grown on annealed c-plane sapphire substrates

Applied Physics Letters

Volumn 101, Issue 5, 2012, Pages

  Brockman, J ^a,b   Samant, M G ^a   Roche, K P ^a   Parkin, S S P ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

C-PLANE SAPPHIRE SUBSTRATES; CRYSTALLINE DEFECTS; HIGH TEMPERATURE PHASE; IN-SITU; METALLIC PHASE; PLASMA-ASSISTED MOLECULAR BEAM EPITAXY; STRUCTURAL DISORDERS; ULTRA SMOOTH SURFACE;

ANNEALING; ELECTRONIC PROPERTIES; EPITAXIAL GROWTH; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; THIN FILMS; X RAY DIFFRACTION;

SUBSTRATES;

EID: 84864645365     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4742160     Document Type: Article

References (24)

1. N. F. Mott, Metal-Insulator Transitions (Taylor Francis, London, 1990).
2. M. Imada, A. Fujimori, and Y. Tokura, Rev. Mod. Phys. 70, 1039 (1998). 10.1103/RevModPhys.70.1039
3. P. D. Dernier and M. Marezio, Phys. Rev. B 2, 3771 (1970). 10.1103/PhysRevB.2.3771
4. D. B. McWhan, A. Menth, J. P. Remeika, W. F. Brinkman, and T. M. Rice, Phys. Rev. B 7, 1920 (1973). 10.1103/PhysRevB.7.1920
5. H. Kuwamoto, J. M. Honig, and J. Appel, Phys. Rev. B 22, 2626 (1980). 10.1103/PhysRevB.22.2626
6. Y. Ueda, K. Kosuge, and S. Kachi, J. Solid State Chem. 31, 171 (1980). 10.1016/0022-4596(80)90019-5
7. S. A. Shivashankar and J. M. Honig, Phys. Rev. B 28, 5695 (1983). 10.1103/PhysRevB.28.5695
8. P. Pfalzer, G. Obermeier, M. Klemm, S. Horn, and M. L. denBoer, Phys. Rev. B 73 (14), 144106 (2006). 10.1103/PhysRevB.73.144106
9. M. S. Laad, L. Craco, and E. Müller-Hartmann, Phys. Rev. B 73 (4), 045109 (2006). 10.1103/PhysRevB.73.045109
10. F. Rodolakis, P. Hansmann, J.-P. Rueff, A. Toschi, M. W. Haverkort, G. Sangiovanni, A. Tanaka, T. Saha-Dasgupta, O. K. Andersen, K. Held, M. Sikora, I. Alliot, J.-P. Itie, F. Baudelet, P. Wzietek, P. Metcalf, and M. Marsi, Phys. Rev. Lett. 104 (4), 047401 (2010). 10.1103/PhysRevLett.104.047401
11. C. H. Ahn, A. Bhattacharya, M. Di Ventra, J. N. Eckstein, C. Daniel Frisbie, M. E. Gershenson, A. M. Goldman, I. H. Inoue, J. Mannhart, A. J. Millis, A. F. Morpurgo, D. Natelson, and J.-M. Triscone, Rev. Mod. Phys. 78 (4), 1185 (2006). 10.1103/RevModPhys.78.1185
12. B. Sass, C. Tusche, W. Felsch, N. Quaas, A. Weismann, and M. Wenderoth, J. Phys.: Condens. Matter 16, 77 (2004). 10.1088/0953-8984/16/1/008
13. H. Schuler, S. Klimm, G. Weissmann, C. Renner, and S. Horn, Thin Solid Films 299, 119 (1997). 10.1016/S0040-6090(96)09399-6
14. L. Dillemans, R. R. Lieten, M. Menghini, T. Smets, J. W. Seo, and J. P. Locquet, Thin Solid Films 520, 4730 (2012). 10.1016/j.tsf.2011.11.064
15. Q. Luo, Q. L. Guo, and E. G. Wang, Appl. Phys. Lett. 84, 2337 (2004). 10.1063/1.1690107
16. P. A. Metcalf, S. Guha, L. P. Gonzalez, J. O. Barnes, E. B. Slamovich, and J. M. Honig, Thin Solid Films 515, 3421 (2007). 10.1016/j.tsf.2006.10.003
17. S. Autier-Laurent, B. Mercey, D. Chippaux, P. Limelette, and C. Simon, Phys. Rev. B 74, 195109 (2006). 10.1103/PhysRevB.74.195109
18. B. S. Allimi, M. Aindow, and S. P. Alpay, Appl. Phys. Lett. 93, 112109 (2008). 10.1063/1.2978352
19. J. Brockman, N. P. Aetukuri, T. Topuria, M. G. Samant, K. P. Roche, and S. S. P. Parkin, Appl. Phys. Lett. 98, 152105 (2011). 10.1063/1.3574910
20. M. Yoshimoto, T. Maeda, T. Ohnishi, H. Koinuma, O. Ishiyama, M. Shinohara, M. Kubo, R. Miura, and A. Miyamoto, Appl. Phys. Lett. 67 (18), 2615 (1995). 10.1063/1.114313
21. B. S. Allimi, S. P. Alpay, D. Goberman, T. Huang, J. I. Budnick, D. M. Pease, and A. I. Frenkel, J. Mater. Res. 22 (10), 2825 (2007). 10.1557/JMR.2007.0378
22. B. E. Warren, X-Ray Diffraction (Dover, 1969).
23. M. Birkholz, P. F. Fewster, and C. Genzel, Thin Film Analysis By X-Ray Scattering (Wiley-VCH, 2006).
24. T. M. Rice and W. F. Brinkman, Phys. Rev. B 5 (11), 4350 (1972). 10.1103/PhysRevB.5.4350