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Volumn 117, Issue , 2010, Pages 275-286

In Situ TEM Electrical and Mechanical Probing of Individual Multi-walled Boron Nitride Nanotubes

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EID: 84864286075     PISSN: 03034216     EISSN: 14370859     Source Type: Book Series    
DOI: 10.1007/978-3-642-03622-4_20     Document Type: Article
Times cited : (2)

References (36)
  • 23
    • 84969202907 scopus 로고    scopus 로고
    • ed. by Z.L. Wang, C. Hui (Kluwer Academic Publishers, Boston/Dordrecht/London, 2003), 279, 280, 281
    • Z.L. Wang, in Electron Microscopy of Nanotubes, ed. by Z.L. Wang, C. Hui (Kluwer Academic Publishers, Boston/Dordrecht/London, 2003) pp. 174-177 279, 280, 281
    • Electron Microscopy of Nanotubes , pp. 174-177
    • Wang, Z.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.