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Volumn 5, Issue 7, 2012, Pages

Characterization of Ni-GaSb alloys formed by direct reaction of Ni with GaSb

Author keywords

[No Author keywords available]

Indexed keywords

DIRECT REACTIONS; FORMATION PROCESS; LOW RESISTIVITY; METAL SOURCE/DRAIN; OXIDE SEMICONDUCTOR; P-MOSFETS; SCHOTTKY BARRIER HEIGHTS; SELF-ALIGNED;

MOS DEVICES; MOSFET DEVICES; SEMICONDUCTOR METAL BOUNDARIES;

GALLIUM ALLOYS;

EID: 84863763211 PISSN: 18820778 EISSN: 18820786 Source Type: Journal
DOI: 10.1143/APEX.5.071201 Document Type: Article

Times cited : (24)

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