Spectroscopic ellipsometry investigations of the optical constants of nanocrystalline SnS thin films

Physica Scripta

Volumn 86, Issue 1, 2012, Pages

  Shaaban, E R ^a   Abd El Sadek, M S ^b   El Hagary, M ^c,d   Yahia, I S ^e  

^a AL AZHAR UNIVERSITY   (Egypt)

^b SOUTH VALLEY UNIVERSITY   (Egypt)

^c QASSIM UNIVERSITY   (Saudi Arabia)

^d Helwan University   (Egypt)

^e Ain Shams University   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

CLEANED GLASS SUBSTRATES; ELLIPSOMETRIC PARAMETERS; INDIRECT TRANSITION; MICRO-STRAIN; MICROSTRUCTURE PARAMETERS; NANOCRYSTALLINES; POLYCRYSTALLINE; SNS FILMS; SNS THIN FILMS; STRUCTURAL CHARACTERISTICS; THERMAL EVAPORATION TECHNIQUE; THREE-LAYER MODELS; TIN SULFIDE; WAVELENGTH RANGES; XRD;

FILM THICKNESS; OPTICAL CONSTANTS; REFRACTIVE INDEX; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; THERMAL EVAPORATION; TIN; X RAY DIFFRACTION;

THIN FILMS;

EID: 84863730097     PISSN: 00318949     EISSN: 14024896     Source Type: Journal    
DOI: 10.1088/0031-8949/86/01/015702     Document Type: Article

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