Optical properties of NiO thin films grown by using sputtering deposition and studied with spectroscopic ellipsometry

Journal of the Korean Physical Society

Volumn 52, Issue 6, 2008, Pages 1868-1876

  Park, Jun Woo ^a   Choi, Kwang Nam ^a   Baek, Seoung Ho ^a   Chung, Kwan Soo ^a   Hosun, L E E ^a  

^a Kyung Hee University   (South Korea)

Author keywords

Band gap; Dielectric function; Nio thin films; Spectroscopic ellipsometry; Sputtering deposition

Indexed keywords

EID: 46849108095     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.52.1868     Document Type: Article

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