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Volumn 100, Issue 2, 2006, Pages

Microstructure dependent physical properties of evaporated tin sulfide films

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS SCIENCE; PHOSPHORUS; PHOTOVOLTAIC EFFECTS; SEMICONDUCTOR MATERIALS; THERMAL EFFECTS; THIN FILMS; TOXIC MATERIALS;

EID: 33746843505     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2216790     Document Type: Article
Times cited : (140)

References (45)
  • 35
    • 0003472812 scopus 로고
    • Addision-Wesley, London
    • B. E. Warren, X-ray diffraction (Addision-Wesley, London, 1969), p. 18.
    • (1969) X-ray Diffraction , pp. 18
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.