Spectroscopic ellipsometry study of SrBi2Ta2O9 ferroelectric thin films

Applied Physics Letters

Volumn 79, Issue 11, 2001, Pages 1664-1666

  Bahng, Jae Ho ^a   Lee, Mierie ^a   Park, H L ^a   Won III, Kim ^b   Jeong, Jung Hyun ^c   Kim, Kwang Joo ^d  

^a Yonsei University   (South Korea)

^b University of Ulsan   (South Korea)

^c Pukyong National University   (South Korea)

^d Konkuk University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001484951     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1402654     Document Type: Article

References (17)

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