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Volumn , Issue , 2012, Pages 567-572

Test-data volume optimization for diagnosis

Author keywords

diagnosis; statistical learning; test cost; test data collection

Indexed keywords

FAILURE CHARACTERISTICS; LIMITED DATA; STATISTICAL LEARNING; STATISTICAL LEARNING TECHNIQUES; TEST COST; TEST DATA; TEST EXECUTION; TEST PATTERN; TEST-DATA VOLUME;

EID: 84863549502     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2228360.2228462     Document Type: Conference Paper
Times cited : (52)

References (16)
  • 1
    • 33846116584 scopus 로고    scopus 로고
    • Statistical Test Compaction Using Binary Decision Trees
    • S. Biswas and R. D. Blanton, "Statistical Test Compaction Using Binary Decision Trees,"IEEE Des. Test. Comput., vol. 23, no. 6, pp. 452-462, 2006.
    • (2006) IEEE Des. Test. Comput. , vol.23 , Issue.6 , pp. 452-462
    • Biswas, S.1    Blanton, R.D.2
  • 2
    • 84855798675 scopus 로고    scopus 로고
    • Optimal Test Set Selection for Fault Diagnosis Improvement
    • L. Amati, C. Bolchini, and F. Salice, "Optimal Test Set Selection for Fault Diagnosis Improvement," IEEE DFT, pp.93-99, 2011.
    • (2011) IEEE DFT , pp. 93-99
    • Amati, L.1    Bolchini, C.2    Salice, F.3
  • 3
    • 70449440574 scopus 로고    scopus 로고
    • A Two Phase Approach for Minimal Diagnostic Test Set Generation
    • M. Shukoor and V. Agrawal, "A Two Phase Approach for Minimal Diagnostic Test Set Generation," IEEE ETS, pp. 115-120, 2009.
    • (2009) IEEE ETS , pp. 115-120
    • Shukoor, M.1    Agrawal, V.2
  • 4
    • 84863550389 scopus 로고    scopus 로고
    • Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
    • Y. Higami et al., "Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits," IEEE ASPDAC, 2006.
    • (2006) IEEE ASPDAC
    • Higami, Y.1
  • 5
    • 78649862287 scopus 로고    scopus 로고
    • A Formal Condition to Stop an Incremental Automatic Functional Diagnosis
    • L. Amati et al., "A Formal Condition to Stop an Incremental Automatic Functional Diagnosis," IEEE DSD, pp. 637-643, 2010.
    • (2010) IEEE DSD , pp. 637-643
    • Amati, L.1
  • 7
    • 79959644377 scopus 로고    scopus 로고
    • SLIDER: A Fast and Accurate Defect Simulation Framework
    • W. C. Tam and R. D. Blanton, "SLIDER: A Fast and Accurate Defect Simulation Framework," IEEE VLSI, pp. 172-177, 2011.
    • (2011) IEEE VLSI , pp. 172-177
    • Tam, W.C.1    Blanton, R.D.2
  • 8
    • 34248150096 scopus 로고    scopus 로고
    • A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior
    • R. Desineni, O. Poku, and R. D. Blanton, "A Logic Diagnosis Methodology for Improved Localization and Extraction of Accurate Defect Behavior," IEEE ITC, 2006.
    • (2006) IEEE ITC
    • Desineni, R.1    Poku, O.2    Blanton, R.D.3
  • 9
    • 84863548251 scopus 로고    scopus 로고
    • Available
    • TetraMAX ATPG [Online]. Available: http://www.synopsys.com/Tools/ Implementation/RTLSynthesis/Pages/TetraMAXATPG.aspx.
    • TetraMAX ATPG [Online]
  • 12
    • 84926662675 scopus 로고
    • Nearest Neighbor Pattern Classification
    • T. Cover and P. Hart, "Nearest Neighbor Pattern Classification, " IEEE Trans. Inf. Theory , IT-11, 21-27, 1967.
    • (1967) IEEE Trans. Inf. Theory , vol.IT-11 , pp. 21-27
    • Cover, T.1    Hart, P.2
  • 14
    • 67049162745 scopus 로고    scopus 로고
    • Similarity Learning for Nearest Neighbor Classification
    • A.M. Qamar et al., "Similarity Learning for Nearest Neighbor Classification,"IEEE ICDM, pp.983-988, 2008.
    • (2008) IEEE ICDM , pp. 983-988
    • Qamar, A.M.1
  • 16
    • 33646901319 scopus 로고    scopus 로고
    • Specification Test Compaction for Analog Circuits and MEMS
    • S. Biswas and R. D. Blanton, "Specification Test Compaction for Analog Circuits and MEMS," IEEE DATE, pp. 164-169, 2005.
    • (2005) IEEE DATE , pp. 164-169
    • Biswas, S.1    Blanton, R.D.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.